Logic Chip Testing

Logic chip testing is finding out whether a digital integrated circuit (a gate, counter, buffer, RAM, ROM or custom chip) is doing its job, either in the machine or on a tester. On an old board a missing picture, a crash or a wrong memory count usually comes down to one chip among dozens, and most of the methods here narrow the list without unsoldering anything. A chip should only be condemned after its supply, clock and inputs have been checked, because a good chip with a bad input gives a wrong output.
When to use it
[edit | edit source]- The machine's symptoms or its diagnostic ROM point at a group of chips. The Commodore 64 PLA Replacement and Commodore 64 RAM Replacement guides are examples.
- A signal is stuck high or low, or missing, at a chip's output while its inputs are correct. Tracing the signal to that chip is covered in Continuity Testing and Signal Tracing.
- A fault appears only after the machine warms up, or clears when it is cooled.[1][2]
- A chip already out of the board needs checking before it is thrown away or refitted, or a second-hand replacement needs checking before it is fitted.[3]
If a supply rail is pulled down or a chip is running very hot, start with Finding Short Circuits.
Safety
[edit | edit source]- Logic chips are damaged by static. Use an earthed wrist strap with its built-in resistor.[4]
- Switch off before fitting, removing or piggybacking a chip. Carlsen warns that a piggybacked test chip fitted the wrong way round will probably be damaged when power is applied.[5]
- Freeze spray puts a static charge on what it hits; use an anti-static grade on static-sensitive boards.[1]
Tools and materials
[edit | edit source]- The datasheet or pinout for every chip under test. Most 14-pin 74-series chips have their supply on pin 14 and ground on pin 7, as on the 74LS00, but not all: the 7490 and 74LS90 counters take their supply on pin 5 and ground on pin 10.[6][7]
- A multimeter and an oscilloscope.[4]
- A logic probe. Hewlett-Packard's 545A used TTL thresholds of 2.0 V and 0.8 V, matching the 74LS00's specified input levels, or CMOS thresholds of 70 % and 30 % of its supply.[8][6]
- A logic pulser, to drive a node to the opposite state on demand.[8][9]
- A logic clip, which shows the state of all 16 pins of a DIP chip at once.[8]
- Known-good chips of the same types, for substitution and piggybacking.[5][10]
- Optionally an out-of-circuit tester. The Retro Chip Tester Professional from 8Bit-Museum.de tests static and dynamic RAM, ROMs and EPROMs, and over 1,200 TTL and CMOS logic chips; it also saves ROM contents to a memory card and names known ROMs from a database of 400,000 entries.[3]
- Optionally an analogue signature analyser, such as a Huntron Tracker, for comparing a dead board with a good one with the power off.[11]
- Electronics freeze spray, and a hair dryer, for heat-related faults.[1][2]
Procedure
[edit | edit source]Check the chip's surroundings first
[edit | edit source]- Measure the supply at the chip's own supply and ground pins, taken from its datasheet. 74-series TTL is specified for 4.75 to 5.25 V.[6]
- Check the clock and reset signals that reach the chip. Commodore lists the power supply and the reset and clock circuits alongside the chips themselves as causes of a C64 that will not run its diagnostic cartridge.[10]
- Check each input with the logic probe. A dim lamp on an input means it is floating or sitting between logic levels, which is a fault in whatever drives it, or an open track.[12]
Check the logic in circuit
[edit | edit source]- For a gate or other combinational chip, read every input and output with the logic probe and compare the output with the chip's truth table for those inputs. HP describes the logic probe being used in this way to verify combinational relationships.[12]
- For a counter, latch, shift register or flip-flop, use the logic pulser to clock it or to set and clear it, and watch the outputs with the logic probe or a logic clip. HP's pulser and clip were designed to be used together to step a chip through its truth table.[8][9]
- Where nothing on the board is moving, the pulser can stand in for the clock, a pulse at a time.[12]
- If an output is stuck, decide whether the chip is failing to drive it or something else on the node is holding it. HP's current tracer shows a large current from a working driver into a shorted input, and almost none from a dead driver.[13] Commodore's manual uses a cut instead: it cuts the PLA's CASRAM pin and measures the cut pin, so that a good signal on the pin clears the PLA and points at the RAM.[10]
Compare against a reference chip in circuit
[edit | edit source]HP's 10529A logic comparator clipped onto a 14- or 16-pin TTL or DTL chip in a powered circuit and compared it pin by pin with a known-good reference chip of the same type fitted in the comparator. It lit a lamp for any pin that differed, and stretched errors as short as 200 to 300 ns so they could be seen. HP points out that a failed input pin shows up as an error on the chip that drives it, so the comparator points to a faulty node, not always to the faulty chip.[8]
Piggyback a known-good chip
[edit | edit source]
Piggybacking puts a known-good chip on top of a suspect one, pin to pin, so that the two work in parallel. It is used mostly on RAM, where a board has many identical chips.[5] Ray Carlsen's method for the Commodore 64:[5]
- Press the pins of the known-good chip against a flat surface to bend them in slightly, so that it grips the chip below.
- Switch off. Fit the test chip on top of the first suspect chip, notch over notch, with every pin touching its partner and none touching a neighbour.
- Switch on and watch the symptom. On the C64 Carlsen watches the bytes-free figure on the start-up screen; if it changes, even without becoming correct, the chip underneath is the suspect.
- Switch off and move the test chip to the next chip, until every chip has been tried.
- Replace the suspect chip. Never leave the piggybacked chip in place: Carlsen warns that it can cause timing problems or stop working, and that the board chip can go on deteriorating until it shorts.
Piggybacking has limits. It does not work on a chip that has failed short and holds the machine at a blank screen.[5] Terry Stewart found that it often, but not always, finds the failed RAM in an Atari 800XL, and another owner's machine stopped working when he tried it; a chip can only be piggybacked on one with the same pin count and pinout.[14]
Heat and cold
[edit | edit source]- Feel the chips with the machine running. Carlsen finds that C64 RAM normally runs barely warm, and that a chip that gets hot quickly, or noticeably warmer than the others of its type, is bad.[5] Some chips run hot when working: an original C64 PLA does, so its temperature alone proves little.[10]
- For a fault that appears after warm-up, let the machine run until it fails, then spray the suspect chips one at a time with freeze spray. The chip whose cooling brings the machine back is the faulty one.[1][2]
- Goldklang also uses a hair dryer to locate thermal problems, warming the area where the fault is suspected.[2]
Substitute
[edit | edit source]- Where the chip is socketed, swap it for a known-good one of the same type. Carlsen notes that substitution is the only practical way to test many of these chips.[10]
- Where Atari's or the manufacturer's flowchart gives an order, follow it. Atari's 2600 procedure swaps the 6507, the 6532 and the TIA in turn, leaving each known-good chip in place when it does not cure the fault.[15]
- To check a suspect chip, fit it in a known-good machine. Sinclair's QL manual says to test a suspect chip in a known-good QL, not to put a good chip into the faulty one.[16]
- Where the chip is soldered in, desolder it intact unless you are sure it has failed, because it may turn out to be good, and fit a socket.[10] See IC Removal and Socketing and Through-Hole Desoldering.
Test out of circuit
[edit | edit source]- Fit the chip in the tester's socket, the right way round, and choose its type or let the tester identify it.[3]
- For RAM, the Retro Chip Tester reports the failing memory cells, and can store the result on a memory card.[3]
- For a ROM or EPROM, read its contents and compare them with a known-good image; the Retro Chip Tester names ROMs it recognises from its database.[3]
- If the fault in the machine was intermittent or heat-related, put the chip back and repeat the heat and cold tests above before trusting a pass.[1]
Compare a dead board with a good one, power off
[edit | edit source]Analogue signature analysis applies a current-limited AC sine wave across two points of a component or circuit, and displays current against voltage. The pattern is compared with the same point on a known-good board. Huntron, whose Tracker instruments do this, lists the advantages: the board need not power up, the test cannot damage it further, and no schematic is needed. It does not test function, and reading the patterns takes experience.[11]
- Switch off and disconnect the board under test and the known-good board.
- Put the instrument's leads on the same pin of the same chip on each board in turn.
- Look for a pin whose pattern differs. Huntron's examples include a damaged input junction on a 74S04 and a capacitor whose connection had come open.[11]
| Fault | Methods | Notes |
|---|---|---|
| Wrong output from a gate or counter | Logic probe, pulser and clip; comparator | Check supply and inputs first[12][8] |
| Node stuck high or low | Current tracer; cutting or lifting a pin | Tells a dead driver from a shorted input[13][10] |
| One of a bank of identical RAM chips | Piggyback; diagnostic ROM; heat | Piggybacking fails on a chip that has failed short[5] |
| Fault after warm-up | Freeze spray; hair dryer | Cool or warm one chip at a time[1][2] |
| Socketed chip under suspicion | Substitution | Test the suspect in a known-good machine[10][16] |
| Board will not power up | Analogue signature analysis | Needs a known-good board to compare[11] |
| Removed chip or new stock | Out-of-circuit tester | Confirm in the machine if the fault was intermittent[3] |
Checking the repair
[edit | edit source]- Remove any piggybacked test chips.[5]
- Power up and repeat the test that showed the fault: the start-up screen, the memory count or the machine's diagnostic ROM.
- Run the machine long enough to warm up, and switch it off and on several times. Carlsen's PLA check on the C64 is to switch off and on rapidly several times and watch for a bad screen.[10]
- Check the power supply that feeds the board. Carlsen finds that shorted C64 RAM usually points to a failing power supply, which must be checked before the machine is used again.[5]
Common mistakes
[edit | edit source]- Condemning a chip whose supply, clock or inputs are wrong.[10][12]
- Taking the supply pins of one chip for those of another. Not every 14-pin chip has its supply on pin 14.[7]
- Using TTL thresholds on a CMOS circuit, or the other way round, on the logic probe.[12]
- Fitting a piggyback chip backwards, or leaving it in place after the test.[5]
- Expecting piggybacking to find a chip that has failed short.[5]
- Reading a hot chip as a bad one when that type runs hot when working.[10]
- Fitting a good chip into a board that has just destroyed one, before finding out why.[16][5]
- Desoldering a chip that turns out to be good, and damaging its pads in the process.[10]
- Blaming the chip a logic comparator flags when the fault is an input on another chip on the same node.[8]
Worked examples on this wiki
[edit | edit source]- Commodore 64 PLA Replacement: substitution, Commodore's signal checks with the diagnostic cartridge, and the cut-pin test on the PLA's CASRAM pin.
- Commodore 64 RAM Replacement: the Dead Test flash codes, the heat check, piggybacking and Commodore's checks on each RAM chip.
- Atari 800XL RAM Replacement: Terry Stewart's piggyback test that found the failed 4264 at U14.
- Sinclair ZX Spectrum RAM Replacement: substitution and holding a known-good chip on each suspect chip.
- Atari 2600 TIA, 6507 and 6532 Replacement: Atari's order for swapping the three main chips with known-good parts.
- TRS-80 Model 16 Troubleshooting Guide: freeze spray or a hair dryer for intermittent faults.
Related pages
[edit | edit source]- Continuity Testing and Signal Tracing
- Finding Short Circuits
- Testing Diodes, Transistors and Regulators
- IC Removal and Socketing
- Through-Hole Desoldering
- Recommended Tools
References
[edit | edit source]- ↑ 1.0 1.1 1.2 1.3 1.4 1.5 Techspray, "Using Freeze Spray to Diagnose Faulty Electronics": if a device overheats and shuts down, spray suspect areas until it starts again to identify the faulty component; spraying generates static, and an anti-static freezer is sold for static-sensitive devices. Retrieved 25 October 2026.
- ↑ 2.0 2.1 2.2 2.3 2.4 Ira Goldklang, "TRS-80 Troubleshooting Guide and Repair Q&A", Ira Goldklang's TRS-80 Revived Site: freeze sections of the suspect board to find an intermittent; inverted canned air works as well as freeze spray; a hairdryer helps locate thermal problems. Retrieved 25 October 2026.
- ↑ 3.0 3.1 3.2 3.3 3.4 3.5 8Bit-Museum.de, "Retro Chip Tester Professional (RCT)": tests SRAMs, DRAMs and (E)(P)ROMs and over 1,200 TTL and CMOS logic ICs; identifies defective memory cells and can store results on a memory card; saves ROM contents and names known ROMs from a database of 400,000 entries. Retrieved 25 October 2026.
- ↑ 4.0 4.1 Recommended Tools, on this wiki: multimeter, oscilloscope, logic probe, and an anti-static wrist strap whose cord contains a current-limiting resistor.
- ↑ 5.00 5.01 5.02 5.03 5.04 5.05 5.06 5.07 5.08 5.09 5.10 5.11 Ray Carlsen, "RAM (Random Access Memory) problems in the C64/128 computer", updated 9 June 2011: the piggyback method, step by step; a backwards test chip will likely be damaged; never leave the piggyback chip in place; the method will not work with shorted chips that give a blank screen; RAM runs barely warm, and any that get hot quickly or warmer than the others are bad; shorted RAM usually points to a failing power supply. Retrieved 25 October 2026.
- ↑ 6.0 6.1 6.2 Texas Instruments, SN74LS00 Quadruple 2-Input Positive-NAND Gates datasheet, SDLS025D, revised May 2017: VCC pin 14 and GND pin 7 on the 14-pin packages; SN74xx00 supply 4.75 to 5.25 V; inputs VIH 2 V and VIL 0.8 V. PDF. Retrieved 25 October 2026.
- ↑ 7.0 7.1 Texas Instruments, SN7490A ... SN74LS93 Decade, Divide-by-Twelve and Binary Counters datasheet, SDLS940A, March 1974, revised March 1988, p. 1, pin diagrams: on the SN7490A and SN74LS90, VCC is pin 5 and GND is pin 10. PDF. Retrieved 25 October 2026.
- ↑ 8.0 8.1 8.2 8.3 8.4 8.5 8.6 Hewlett-Packard, catalogue pages "Digital Circuit Testers: Logic Probe, Logic Pulser, Digital Current Tracer, Models 545A, 546A, 547A" and "Logic Clip, Logic Comparator, Models 548A and 10529A", held by Trinity College Dublin School of Computer Science and Statistics with object TCD-SCSS-T.20160121.006, PDF: 545A thresholds; 546A pulses nodes to the opposite state; 548A clip shows 16 pins and finds the supply pins itself; pulser and clip used together to step an IC through its truth table; 10529A comparator clips onto powered TTL or DTL ICs, compares with a reference IC, detects errors of 200 ns (reference board) or 300 ns (socket board), and shows a failed input as a failure on the driving IC. Retrieved 25 October 2026.
- ↑ 9.0 9.1 Barry Bronson and Anthony Y. Chan, "A Multifunction, Multifamily Logic Pulser", Hewlett-Packard Journal, December 1976, pp. 12-15 (same PDF): pulses inject the opposite state without cutting traces or removing ICs; presetting, clearing or clocking flip-flops, counters and shift registers.
- ↑ 10.00 10.01 10.02 10.03 10.04 10.05 10.06 10.07 10.08 10.09 10.10 10.11 Commodore 64 PLA Replacement, on this wiki, citing Ray Carlsen and Commodore's manuals: substitution is the only practical way to check most of these chips; an original PLA runs hot when working; desolder a suspect PLA intact; the cut-pin test on CASRAM (pin 18); Commodore's list of causes for no Dead Test result (power supply, reset and clock circuits, 6510, VIC-II, PLA); rapid off-and-on test.
- ↑ 11.0 11.1 11.2 11.3 Curtis Smith, Huntron, Inc., "Analog Signature Analysis as a Troubleshooting Method": a current-limited AC sine wave across two points; comparison with known-good boards; power-off testing needs no schematic and cannot damage the board further; it does not test function and interpretation takes experience; examples of a damaged 74S04 junction and an open connection to a capacitor. Retrieved 25 October 2026.
- ↑ 12.0 12.1 12.2 12.3 12.4 12.5 Robert C. Quenelle, "New Logic Probe Troubleshoots Many Logic Families", Hewlett-Packard Journal, December 1976, pp. 9-11, PDF at Trinity College Dublin: TTL or CMOS thresholds; a dim lamp for a voltage between logic levels, an open circuit or a floating input; verifying combinational relationships; replacing the clock with single pulses from a pulser. Retrieved 25 October 2026.
- ↑ 13.0 13.1 John F. Beckwith, "Current Tracer: A New Way to Find Low-Impedance Logic-Circuit Faults", Hewlett-Packard Journal, December 1976, pp. 2-8 (same PDF): a stuck node caused by a dead driver shows little current; one caused by a shorted input shows a large current that can be followed to the input.
- ↑ Atari 800XL RAM Replacement, on this wiki, section "Piggyback test", citing Terry Stewart's 2010 and 2011 forum posts: piggybacking often but not always works on the 800XL; another owner's machine stopped working; a 16-pin chip cannot be piggybacked on an 18-pin part.
- ↑ Atari 2600 TIA, 6507 and 6532 Replacement, on this wiki, citing Atari's field service manual: swap the chips one at a time with known-good parts in the order the chart gives, leaving each in place when it does not cure the fault.
- ↑ 16.0 16.1 16.2 Sinclair QL RGB Port Repair, on this wiki, section "When the ZX8301 output itself is missing", citing Sinclair's QL Service Manual: to test a suspect chip, fit it in a known-good QL, not a good chip in the faulty one.